I’m Looking Through You!
Using Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) to characterize defects, ultrastructures and composition.
Transmission Electron Microscopy and Scanning Transmission Electron Microscopy (TEM and STEM) have been used in research and engineering development for many years. And while Analytical Answers performed some specialized STEM work in the past, we are pleased to re-introduce (S)TEM to our analytical capabilities – but with state-of-the-art instrumentation.
This will be a fast-paced webinar focusing on the application of TEM and STEM to characterize features of a wide range of samples, including semiconductors, nanoparticles, epitaxial growth, and metal thin films. High spatial resolution analysis, electron diffraction, and imaging of lattice structure and layer interfaces will be demonstrated.