Our lives are continuously improving with new technology, which is driven by the development of new materials and pushing the limits of existing technologies. Structural analysis of these materials is increasingly challenging using traditional (mechanical) cross sectioning methods, which may not preserve the delicate structures found in samples from many industries, such as semiconductor, optical coatings, polymer films, and composite or nanostructured materials. Find out how you can benefit from Broad Ion Beam milling to polish sections hundreds of times larger than FIB with a quality on par with FIB sections.