Interested in learning about the latest in analytical chemistry and materials science? We produce monthly educational webinars on the latest techniques. View our recorded webinars here, and check our homepage to be notified of our next live webinar.
Double Take on Electromechanical Devices, Switches, and Relays
DATE: Tue, Jan 21, 2020
Time: 12:00 PM – 1:00 PM
When it comes to materials analysis and problem solving, you want to be sure you have complete answers, not just any answer. Sometimes that means doing a double-take – or even a triple-take – using multiple techniques to characterize your materials or ensure that failures are thoroughly examined to help you get to the root cause. This type of multi-method analysis can provide you with the information you need to avoid making decisions about your next steps based on partial information… which often leads to more problems.
In this Fall webinar series, you’ll learn about combinations of analyses that work together to diagnose common failures. We’ll look at a range of materials, from a wide spectrum of applications. These materials will include products from across multiple industries, including electronics, consumer goods, and biomedical devices. The common theme will be materials and failures that require a range of analysis methods to provide a complete picture.
Our January webinar will focus on Electromechanical Devices, Switches, and Relays
Join us for the fourth session in this webinar series, on January 21 at 12 noon.
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Small Spot ESCA
The trend in manufacturing has been a constant push to smaller, more compact devices of all kinds. With our enhanced, microfocused capabilities in Electron Spectroscopy for Chemical Analysis (ESCA) a.k.a. X-ray Photoelectron Spectroscopy (XPS) we analyze surface chemistry on those micro-devices and many other materials.
Broad Ion Beam Milling (BIB)
Find out how you can benefit from Broad Ion Beam milling to polish sections hundreds of times larger than FIB with a quality on par with FIB sections.
I’m Looking Through You!
Using Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) to characterize defects, ultrastructures and composition
Mapping the Nano
The advancement of SEM technology establishes new boundaries for high spatial resolution EDS mapping
Mapping in Minutes
Fast Mapping will give you an inside look at several topics in Scanning Electron Microscopy (SEM), such as data, results, failure analysis and much more – in less time.
Polymer Analysis of Biomaterials Composites, Encapsulants and Adhesives
Identifying the molecular structure of materials, components or contaminants using Fourier Transform Infrared Spectroscopy (FTIR) and hyphenated techniques to solve problems
Surface Chemistry of Biomaterials, Coatings, and Electronic Materials
The success or failure of materials and coatings is often determined in the top few atom layers where the composition and chemistry of materials and contaminants must be understood. See how that’s done.
Thin Film and Multilayer Defect Analysis in Metals, Metal Coatings and Optical Coatings
Focused Ion Beam (FIB) preparation and imaging techniques facilitate additional imaging information but, when paired with other analytical techniques, enables compositional analyses with nanometer instead of micron spatial resolution.
Visualizing Hydration and Dehydration of Pharmaceuticals, Foodstuffs and Other Materials
Introduction to Wet scanning electron microscopy, its advantages and limitations, and how to use it
The Art of Failure Analysis of Printed Circuit Boards (PCBs) and Electronic Components
Root Cause vs. Red Herrings