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Check out our library of on-demand webinars

AAI offers a rich library of on-demand webinars, giving you information on failure analysis and materials analysis on a range of topics. From diagnosing the reasons for electronics failures to materials characterization for medical devices and consumer products, learn about how to get not just any answer, but the answer about product failures.

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Small Spot ESCA

The trend in manufacturing has been a constant push to smaller, more compact devices of all kinds. With our enhanced, microfocused capabilities in Electron Spectroscopy for Chemical Analysis (ESCA) a.k.a. X-ray Photoelectron Spectroscopy (XPS) we analyze surface chemistry on those micro-devices and many other materials.



Broad Ion Beam Milling (BIB)

Find out how you can benefit from Broad Ion Beam milling to polish sections hundreds of times larger than FIB with a quality on par with FIB sections.


looking through

I’m Looking Through You!

Using Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) to characterize defects, ultrastructures and composition



How Do Those Blades Stay So Sharp?

Comparative Analysis of the Coatings Present on Shaving Razors



Mapping the Nano

The advancement of SEM technology establishes new boundaries for high spatial resolution EDS mapping



Mapping in Minutes

Fast Mapping will give you an inside look at several topics in Scanning Electron Microscopy (SEM), such as data, results, failure analysis and much more – in less time.



Polymer Analysis of Biomaterials Composites, Encapsulants and Adhesives

Identifying the molecular structure of materials, components or contaminants using Fourier Transform Infrared Spectroscopy (FTIR) and hyphenated techniques to solve problems


Nano mapping

FIB Demo

Get to know the Focused Ion Beam (FIB) instrument



Surface Chemistry of Biomaterials, Coatings, and Electronic Materials

The success or failure of materials and coatings is often determined in the top few atom layers where the composition and chemistry of materials and contaminants must be understood. See how that’s done.


microscopy moving components

Looking Inside Video

Real-Time Microscopy of Moving Components for Failure Analysis


Metal coating

Thin Film and Multilayer Defect Analysis in Metals, Metal Coatings and Optical Coatings

Focused Ion Beam (FIB) preparation and imaging techniques facilitate additional imaging information but, when paired with other analytical techniques, enables compositional analyses with nanometer instead of micron spatial resolution.



Visualizing Hydration and Dehydration of Pharmaceuticals, Foodstuffs and Other Materials

Introduction to Wet scanning electron microscopy, its advantages and limitations, and how to use it


Art failure analysis printed circuit boards pcbs electronic component

The Art of Failure Analysis of Printed Circuit Boards (PCBs) and Electronic Components

Root Cause vs. Red Herrings


anywhere service live small

Anywhere Services Live

Be in our lab with our scientists to observe and participate in your analysis – no matter where you are. Have your colleagues or vendors join too.