Interested in learning about the latest in analytical chemistry and materials science? We produce monthly educational webinars on the latest techniques. View our recorded webinars here, and check our homepage to be notified of our next live webinar.

 

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ESCA

Small Spot ESCA

The trend in manufacturing has been a constant push to smaller, more compact devices of all kinds. With our enhanced, microfocused capabilities in Electron Spectroscopy for Chemical Analysis (ESCA) a.k.a. X-ray Photoelectron Spectroscopy (XPS) we analyze surface chemistry on those micro-devices and many other materials.

 

BIB

Broad Ion Beam Milling (BIB)

Find out how you can benefit from Broad Ion Beam milling to polish sections hundreds of times larger than FIB with a quality on par with FIB sections.

 

looking through

Looking Through You!

Using Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) to characterize defects, ultrastructures and composition

 

razor

How Do Those Blades Stay So Sharp?

Comparative Analysis of the Coatings Present on Shaving Razors

 

nano-mapping

Mapping the Nano

The advancement of SEM technology establishes new boundaries for high spatial resolution EDS mapping

 

fastmapping

Mapping in Minutes

Fast Mapping will give you an inside look at several topics in Scanning Electron Microscopy (SEM), such as data, results, failure analysis and much more – in less time.

 

polymer

Polymer Analysis of Biomaterials Composites, Encapsulants and Adhesives

Identifying the molecular structure of materials, components or contaminants using Fourier Transform Infrared Spectroscopy (FTIR) and hyphenated techniques to solve problems

 

Nano mapping

FIB Demo

Get to know the Focused Ion Beam (FIB) instrument

 

biomaterialscoatings

Surface Chemistry of Biomaterials, Coatings, and Electronic Materials

The success or failure of materials and coatings is often determined in the top few atom layers where the composition and chemistry of materials and contaminants must be understood. See how that’s done.

 

microscopy moving components

Looking Inside Video

Real-Time Microscopy of Moving Components for Failure Analysis

 

Metal coating

Thin Film and Multilayer Defect Analysis in Metals, Metal Coatings and Optical Coatings

Focused Ion Beam (FIB) preparation and imaging techniques facilitate additional imaging information but, when paired with other analytical techniques, enables compositional analyses with nanometer instead of micron spatial resolution.

 

dehydration

Visualizing Hydration and Dehydration of Pharmaceuticals, Foodstuffs and Other Materials

Introduction to Wet scanning electron microscopy, its advantages and limitations, and how to use it

 

Art failure analysis printed circuit boards pcbs electronic component

The Art of Failure Analysis of Printed Circuit Boards (PCBs) and Electronic Components

Root Cause vs. Red Herrings

 

anywhere service live small

Anywhere Services Live

Be in our lab with our scientists to observe and participate in your analysis – no matter where you are. Have your colleagues or vendors join too.