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Check out our library of on-demand webinars
AAI offers a rich library of on-demand webinars, giving you information on failure analysis and materials analysis on a range of topics. From diagnosing the reasons for electronics failures to materials characterization for medical devices and consumer products, learn about how to get not just any answer, but the answer about product failures.
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Small Spot ESCA
The trend in manufacturing has been a constant push to smaller, more compact devices of all kinds. With our enhanced, microfocused capabilities in Electron Spectroscopy for Chemical Analysis (ESCA) a.k.a. X-ray Photoelectron Spectroscopy (XPS) we analyze surface chemistry on those micro-devices and many other materials.
Broad Ion Beam Milling (BIB)
Find out how you can benefit from Broad Ion Beam milling to polish sections hundreds of times larger than FIB with a quality on par with FIB sections.
I’m Looking Through You!
Using Transmission Electron Microscopy (TEM) and Scanning TEM (STEM) to characterize defects, ultrastructures and composition
Mapping the Nano
The advancement of SEM technology establishes new boundaries for high spatial resolution EDS mapping
Mapping in Minutes
Fast Mapping will give you an inside look at several topics in Scanning Electron Microscopy (SEM), such as data, results, failure analysis and much more – in less time.
Polymer Analysis of Biomaterials Composites, Encapsulants and Adhesives
Identifying the molecular structure of materials, components or contaminants using Fourier Transform Infrared Spectroscopy (FTIR) and hyphenated techniques to solve problems
Surface Chemistry of Biomaterials, Coatings, and Electronic Materials
The success or failure of materials and coatings is often determined in the top few atom layers where the composition and chemistry of materials and contaminants must be understood. See how that’s done.
Thin Film and Multilayer Defect Analysis in Metals, Metal Coatings and Optical Coatings
Focused Ion Beam (FIB) preparation and imaging techniques facilitate additional imaging information but, when paired with other analytical techniques, enables compositional analyses with nanometer instead of micron spatial resolution.
Visualizing Hydration and Dehydration of Pharmaceuticals, Foodstuffs and Other Materials
Introduction to Wet scanning electron microscopy, its advantages and limitations, and how to use it
The Art of Failure Analysis of Printed Circuit Boards (PCBs) and Electronic Components
Root Cause vs. Red Herrings