Scanning Auger Microanalysis
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(Aluminum Foil Samples)
What Is It?
Scanning Auger Microscopy (also known as Auger Electron Spectroscopy) allows for the analysis of the elemental composition of surfaces and interfaces at a highly detailed level.
Why Should I Use It?
This technique typically analyzes at a depth of 2 -3 nm, and with our high-accuracy instrumentation (field emission source) we have the ability to sample with a lateral resolution of better than 30 nm. This allows for the inspection of films with the thickness of only a few monolayers from top down, or layers a few tens of nanometers thick when examined in cross section.
What Do I Get Out of It?
Auger analysis can detect all elements except hydrogen and helium, at concentrations as low as 0.1 atomic percent (depending on element and matrix).
Applications Include:
Materials Evaluation
- Verification of surface homogeneity
- Catalyst degradation
- Interface analysis
- Diffusion studies
- Identification of surface contaminants
Failure Analysis
- Corrosion analysis
- Stain identification
- Lifted lead bond evaluation
- Bond pad contamination
- Material delamination analysis
- Metal embrittlement evaluation
Quality Control
- Comparison of good to bad samples
- Verification of surface process modification
- Relative thickness on thin film.