X-Ray Microscopy (XM)

Through high-resolution, real-time X-ray microscopy, we are able to non-destructively examine the internal structure of samples in real-time, at magnifications up to 1000X. While the internal mechanisms of these samples are usually not visible under other means, XM offers us a tool to watch them in operation.

Unlike static radiography systems, real-time XM allows the sample under examination to be positioned in a direction that permits the best view of a feature of interest. The sample is able to be move in the X, Y and Z directions and can also be tilted and rotated. When images are calibrated, radiopacity (ASTM F640) and linear measurements can be made.

Video recordings of switches, relays, and other mechanical or electromechanical devices can be made to understand their inner workings or perform failure analysis.