Instrumentation Capabilities
The core strength of Analytical Answers is our willingness and ability to work along side our clients. The descriptions below provide an introduction to some of our most utilized instuments and techniques.
Scanning Auger Microanalysis (SAM)
Scanning Auger Microanalysis is a surface analysis technique that determines elemental composition and some chemistry of surfaces and interfaces. It can examine very small spot sizes but is limited to conductive materials. The technique is similar to ESCA in the information it provides but the sample types and areas examined are very different.
Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy is a high resolution, large depth of field imaging technique. It shows topographical and structural information at magnifications from 10X to 300,000X
Focused Ion Beam (FIB)
Focused Ion Beam (FIB) combines high resolution imaging by ion induced secondary electrons or ions, comparable to SEM imaging, with localized milling/etching by ion beam sputtering. This results in a combined high-precision sample preparation tool where cross-sections can be both prepared and imaged in situ in the same instrument.
Electron Spectroscopy for Chemical Analysis (ESCA)
Electron Spectroscopy for Chemical Analysis is a surface analysis technique that determines elemental composition and some chemistry of surfaces and interfaces. ESCA can determine the nature of the chemical bonds on the surface and is valuable for differentiating an organic coating from the base organic material. The technique is similar to Auger in the information it provides but the sample types and areas examined are very different.
Energy Dispersive X-Ray Spectroscopy (EDS)
Energy Dispersive X-Ray Spectroscopy is a technique that qualitatively and quantitatively identifies elemental composition of samples analyzed in a Scanning Electron Microscope (SEM). It has a relatively deep penetration compared to ESCA and Auger.
Fourier Transform Infrared Spectroscopy (FTIR)
Fourier Transform Infrared Spectroscopy is a spectroscopic technique used to analyze both organic and inorganic materials for both qualitative and quantitative analysis. It can examine macro or micro samples and is complementary to EDS, ESCA and Auger analysis.
Fourier Transform Infrared Imaging (FTIRI)
Fourier Transform Infrared Imaging is a spectroscopic technique used to analyze sample down to approximately 5 microns in size. It is used to analyze both organic and inorganic materials for both qualitative and quantitative analysis and is complementary to EDS, ESCA and Auger analysis.
Thermal Analysis
Thermal Analysis are a series of techniques that measure changes in a sample with changing temperature. The techniques measure changes in weight (TGA) or heat flow (DSC) that are characteristic of materials and formulated products.
Visible Light Microscopy (OM/PLM)
The key to any of the techniques Analytical Answers uses is the ability to “see” the sample. Visible light microscopy provides that ability.
X-Ray Microscopy (XM)
X-Ray Microscopy is a non-destructive real-time inspection system with magnifications up to 1000X. It can looked through sealed and sterile packages and examine internals structures of the sample.